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 | Scanning Electron Microscope
JEOL JSM-IT700HR |  | Scanning Electron Microscope
JEOL JSM-6510LA |  | Scanning Electron Microscope
Hitachi S-4300 |  | Transmission Electron Microscope
JEOL JEM-2100F |  | Laser Confocal Microscope
Carl Zeiss LSM710 |  | Laser Microscope
Keyence VK-X3000 |  | Scanning Probe Microscope
Hitachi High-Tech Science AFM5100N |  | Digital Microscope
Keyence VHX-7000 |  | Nuclear Magnetic Resonance Spectrometer [Solid]
JEOL Resonance ECA-400 |  | Nuclear Magnetic Resonance Spectrometer [Liquid]
JEOL Resonance ECS-400 |  | X-ray Photoelectron Spectroscopy
Ulvac Phi VersaProbe CU |  | X-ray Diffractometer
Rigaku SmartLab-RA2D |  | X-ray Diffractometer
Rigaku SmartLab |  | X-ray Diffractometer
Rigaku RINT-2100/PC |  | Curved imaging plate X-ray Diffractometer
Rigaku RINT-RAPID |  | Curved imaging plate X-ray Diffractometer
Rigaku Raxis-Rapid |  | X-ray Fluorescence Spectrometer
Rigaku Primus IV |  | ESI Mass Spectrometer
JEOL JMS-T100CS |  | Inductively Coupled Plasma Spectrometer
Rigaku ICPE-9810 |  | Laser Diffraction Particle Size Analyzer
Shimadzu SALD-2300 |  | IR Spectrometer
JASCO FT/IR-4700 |
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