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Analysis Instruments
 
          |   Scanning Electron Microscope     JEOL JSM-IT700HR/LA   |            |   Scanning Electron Microscope     JEOL JSM-6510LA   |            |   Scanning Electron Microscope     Hitachi S-4300   |            |   Transmission Electron Microscope     JEOL JEM-2100F   |            |   Laser Confocal Microscope     Carl Zeiss LSM710   |            |   Laser Microscope     Keyence VK-X3000   |            |   Scanning Probe Microscope     Hitachi High-Tech Science AFM5100N   |            |   Digital Microscope     Keyence VHX-7000   |            |   Nuclear Magnetic Resonance Spectrometer [Solid]     JEOL JNM-ECA400   |            |   Nuclear Magnetic Resonance Spectrometer [Liquid]     JEOL JNM-ECS400   |            |   X-ray Photoelectron Spectroscopy     Ulvac Phi VersaProbe CU   |            |   X-ray Diffractometer     Rigaku SmartLab-RA2D   |            |   X-ray Diffractometer     Rigaku SmartLab   |            |   X-ray Diffractometer     Rigaku RINT-2100/PC   |            |   Curved imaging plate X-ray Diffractometer     Rigaku RINT-RAPID   |            |   X-ray Fluorescence Spectrometer     Rigaku Primus IV   |            |   ESI Mass Spectrometer     JEOL JMS-T100CS   |            |   Inductively Coupled Plasma Spectrometer     Rigaku ICPE-9810   |            |   Laser Diffraction Particle Size Analyzer     Shimadzu SALD-2300   |            |   IR Spectrometer     JASCO FT/IR-4700   |            |   t-Butyl alcohol freeze dryer     VACUUM DEVICE VFD-30   |                
 
        
          
             
          
         
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